Table 1.
Sample | A [μm3] | B [μm] | C | RMS Roughness [nm] | Correlation Length [μm] |
---|---|---|---|---|---|
30% MeOH | 7.21·10−3 | 11.78 | 2.52 | 14.38 | 2.54 |
40% MeOH | 2.23·10−3 | 9.04 | 2.72 | 10.28 | 1.98 |
50% MeOH | 1.17·10−3 | 7.59 | 3.01 | 7.70 | 1.96 |
60% MeOH | 9.91·10−5 | 1.67 | 4.17 | 8.51 | 0.57 |
Table 1. Fitting parameters acquired from the ABC model. The parameters were used to calculate the RMS roughness and correlation length for each silk film which describe the vertical and lateral features of a topography, respectively (values are represented as the mean of three independent experiments).