Fig. 3. Representative SEM and FIB-SEM micrographs of E. coli seeded on nanowire and flat chips, imaged after centrifugation. (a) and (b) SEM micrographs (imaged at 30°, with no tilt correction), scale bars: 500 nm. (c) FIB-SEM micrographs (imaged at 90°), scale bars: 200 nm.