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. 2021 Jun 9;14(12):3191. doi: 10.3390/ma14123191
DCMS Direct current magnetron sputtering
EDX Energy dispersive X-ray spectroscopy
GIXD Grazing incidence X-ray diffraction
HAADF High-angle annular dark field
HiPIMS High power impulse magnetron sputtering
HRTEM High resolution TEM
SAED Selected area electron diffraction
TEM Transmission electron microscopy
XPS X-ray photoelectron spectroscopy
XRD X-ray diffraction