| SMA | shape memory alloy; |
| γ | austenite phase with face-centered cubic (FCC) crystal lattice; |
| ε | martensite phase with hexagonal close-packed (HCP) crystal lattice; |
| Ms | start temperature of the γ→ε forward martensitic transformation; |
| Mf | finish temperature of the γ→ε forward martensitic transformation; |
| As | start temperature of the ε→γ reverse martensitic transformation; |
| Af | finish temperature of the ε→γ reverse martensitic transformation; |
| TMT | thermomechanical treatment; |
| RHT | reference heat treatment; |
| HR | hot rolling; |
| CR | cold rolling; |
| XRD | X-ray diffraction; |
| 2θ | X-ray diffraction angle; |
| TEM | transmission electron microscopy; |
| BF | bright field; |
| DR | dark field; |
| SAED | selected area electron diffraction; |
| XPS | X-ray photoelectron spectroscopy; |
| E | Young’s modulus; |
| σ 0.05 | dislocation yield stress; |
| εf | residual strain in a mechanical cycle; |
| εacc | accumulated strain after each mechanical cycle; |
| Nmax | number of cycles to failure; |
| OCP | open circuit potential. |