| CP | Conducting plate |
| EM | Electromagnetic |
| EME | Electromagnetic environment |
| MUT | Medium under test |
| NDT | Non-destructive testing |
| OEWP | Open-ended waveguide probe |
| VNA | Vector network analyzer |
| CP | Conducting plate |
| EM | Electromagnetic |
| EME | Electromagnetic environment |
| MUT | Medium under test |
| NDT | Non-destructive testing |
| OEWP | Open-ended waveguide probe |
| VNA | Vector network analyzer |