Table 2.
Selection criteria of data acquisition and post-processing techniques in TCM qualitative analysis.
| Technique | Advantage | Limitation | Scope of application | |
|---|---|---|---|---|
| DIA | DIA | Full coverage of MS1 and MS2 information | Loss link between precursor and product ions | Acquisition of MS/MS information of minor or trace compounds |
| DDA | PIL | Screening of only (or preferred) target ions in the list | Miss of novel compounds with new sub-structures or substituted groups | Target compounds with predictable molecular weights and/or m/z values |
| DE | Detection of less abundant co-eluting ions | Quality loss of MS2 information of abundant ions | MS/MS information of both abundant and less abundant compounds in complex samples | |
| Mass tag | Selective screening of compounds that undergo in-source fragmentations | Not applicable to relatively stable compounds that cannot generate certain in-source fragmentation patterns | Compounds that can undergo certain in-source fragmentations with ISCID energy | |
| PIS | Requirements of little prior-knowledge about the exact structure of target compounds | Miss of compounds without selected product ions | Compounds with known specific product ions | |
| NLS | Targeted screening of modified or conjugated compounds that undergo neutral eliminations | Only compounds with certain neutral eliminations | Compounds with certain neutral eliminations | |
| MRM | High selectivity and sensitivity in screening target compounds | Low resolution and unable to screen unknown compounds without information of parent and product ions | Target compounds with known parent and product ions | |
| Data post-processing | MDF | Selective screening of certain compounds or compound classes and remove of interferences | Requirements of a carefully-designed appropriate MDF region | Compounds with predictable mass range and mass defect range |
| BS | Elimination of background signals, and exposure of target compounds | Poor selectivity of target compounds | Severe background interferences | |
| IPF | Specific screening of compounds with certain elements | Relatively narrow application scope | Compounds with distinct isotope pattern | |
| DIF | Rapid screening of target compounds that produce identical product ions | Miss of compounds without selected product ions | Compounds with known product ion | |
| NLF | Compounds that undergo neutral eliminations | Only compounds with certain neutral eliminations | Compounds with specific neutral loss | |
| MTSF | Rapid classification and characterization of unknown compounds | Need of MSn information for both template compounds and target compounds | Target compounds sharing the same sub-structures and similar MSn mass spectra as template compounds | |
| MN | Rapid classification and characterization of compounds without prior knowledge of the chemical structures | Manual interpretation of detailed structure information of unknown compounds based on the related known compounds | Compounds with MS/MS spectra | |
| SA | Rapid exploration of intrinsic relationships between compound structures and MS data | Further characterization and identification of compounds | Recognition of potential characteristic ions, discrimination of different structures and isomers | |
| DM | Alleviation of labor for mining structural information from large-scale datasets | Limited records in databases and requirements of further manual confirmation | Automatic search and annotation of compounds through on-line or in-house databases | |