DIA |
DIA |
Full coverage of MS1 and MS2 information |
Loss link between precursor and product ions |
Acquisition of MS/MS information of minor or trace compounds |
DDA |
PIL |
Screening of only (or preferred) target ions in the list |
Miss of novel compounds with new sub-structures or substituted groups |
Target compounds with predictable molecular weights and/or m/z values |
DE |
Detection of less abundant co-eluting ions |
Quality loss of MS2 information of abundant ions |
MS/MS information of both abundant and less abundant compounds in complex samples |
Mass tag |
Selective screening of compounds that undergo in-source fragmentations |
Not applicable to relatively stable compounds that cannot generate certain in-source fragmentation patterns |
Compounds that can undergo certain in-source fragmentations with ISCID energy |
PIS |
Requirements of little prior-knowledge about the exact structure of target compounds |
Miss of compounds without selected product ions |
Compounds with known specific product ions |
NLS |
Targeted screening of modified or conjugated compounds that undergo neutral eliminations |
Only compounds with certain neutral eliminations |
Compounds with certain neutral eliminations |
MRM |
High selectivity and sensitivity in screening target compounds |
Low resolution and unable to screen unknown compounds without information of parent and product ions |
Target compounds with known parent and product ions |
Data post-processing |
MDF |
Selective screening of certain compounds or compound classes and remove of interferences |
Requirements of a carefully-designed appropriate MDF region |
Compounds with predictable mass range and mass defect range |
BS |
Elimination of background signals, and exposure of target compounds |
Poor selectivity of target compounds |
Severe background interferences |
IPF |
Specific screening of compounds with certain elements |
Relatively narrow application scope |
Compounds with distinct isotope pattern |
DIF |
Rapid screening of target compounds that produce identical product ions |
Miss of compounds without selected product ions |
Compounds with known product ion |
NLF |
Compounds that undergo neutral eliminations |
Only compounds with certain neutral eliminations |
Compounds with specific neutral loss |
MTSF |
Rapid classification and characterization of unknown compounds |
Need of MSn information for both template compounds and target compounds |
Target compounds sharing the same sub-structures and similar MSn mass spectra as template compounds |
MN |
Rapid classification and characterization of compounds without prior knowledge of the chemical structures |
Manual interpretation of detailed structure information of unknown compounds based on the related known compounds |
Compounds with MS/MS spectra |
SA |
Rapid exploration of intrinsic relationships between compound structures and MS data |
Further characterization and identification of compounds |
Recognition of potential characteristic ions, discrimination of different structures and isomers |
DM |
Alleviation of labor for mining structural information from large-scale datasets |
Limited records in databases and requirements of further manual confirmation |
Automatic search and annotation of compounds through on-line or in-house databases |