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. 2021 Jul 7;11:13993. doi: 10.1038/s41598-021-93278-6

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© The Author(s) 2021

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article's Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article's Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/.

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Atomic force micrographs of the annealed MoS₂ thin films. (a,c) AFM topography (a) and phase (c) micrographs of an optically dark region of the sample shown in Fig. 1b. (b) Height distribution extracted from the image shown in (a). (d) Topographic AFM micrograph recorded at the centre of an optically bright region. Insets: Exemplary height cross-section transversely averaged over about 45 nm.