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. 2021 Jul 3;14(13):3735. doi: 10.3390/ma14133735

Figure 2.

Figure 2

On top, the machined clean titanium plate at SEM. FOV: 134 µm, Mode: 15 kV—Point, Detector: BSD Full. On bottom, the chemical composition analysis of the titanium surface, in spot 1, pointed by a cross in the figure.