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. 2021 Jul 3;14(13):3733. doi: 10.3390/ma14133733

Figure 3.

Figure 3

The SIMS profiles of the Si epitaxial films obtained after ex-situ wet pre-cleaning with 1:200 DHF, dry cleaning, and combined wet + dry cleaning, indicating the concentrations of (a) O, (b) F, and (c) C.