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. 2021 Jul 10;13:155. doi: 10.1007/s40820-021-00675-7

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© The Author(s) 2021

Open AccessThis article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article's Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article's Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 3 — Characterization of Perovskite Films Based on SnO₂ and SnO₂/K Substrates. a X-ray diffraction patterns of the perovskite films deposited on SnO₂ and SnO₂/K substrates. Top view of SEM images of the perovskite films deposited on b SnO₂ substrates and c SnO₂/K substrates. d PL spectra and e TRPL curves of the perovskite films deposited on SnO₂ and SnO₂/K substrates. f Dark I–V curves of the perovskite films based on electron-only devices