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. 2021 May 28;125(22):5991–6003. doi: 10.1021/acs.jpcb.1c01245

Figure 5.

Figure 5

The imaginary component of the total dielectric loss response of the 24 nm P2VP thin film prepared on a silicon substrate as measured at few selected temperatures. The solid line shows the representative fit of the raw data according to the model described in our previous paper.74