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. 2021 Jun 22;13(1):e6334. doi: 10.5195/ijt.2021.6334

Table 4.

Linear Regression Analysis for Familiarity of Technology

Variable Coefficients 95.0 % Confidence interval t-value Significance
Beta Std.error Lower Upper
Age −.268 .093 −.462 −.074 −2.88 .009
CD-RISC .318 .138 .030 .605 2.30 .032
BAI −.452 .224 −.919 .013 −2.02 .057
CRIq tot .133 .077 −.028 .295 1.71 .101
GSE .291 .171 −.067 .649 1.69 .106

Note. Abbreviations: CD-RISC 10, Connor and Davidson Resilience Scale; BAI, Beck Anxiety Inventory; CRIq, Cognitive Reserve Index; GSE, General Self-Efficacy Scale.