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. Author manuscript; available in PMC: 2021 Jul 30.
Published in final edited form as: Proc IEEE Inst Electr Electron Eng. 2015 May 20;103(6):907–925. doi: 10.1109/jproc.2015.2407272

Figure 5.

Figure 5.

Average one-vs-all classification results from three subjects comparing the source (ROI) and sensor data for the different MI tasks (Ext – Extension, Flex – Flexion, Sup – Supination, Pro – Pronation).