Skip to main content
. 2021 Jul 19;125(29):16041–16048. doi: 10.1021/acs.jpcc.1c03549

Table 1. Calculated Threshold Energies (in eV) for the Diagonal and Lateral Jumps of the Bi and Sb Dopants as a Function of the Emission Angle of the Impacted Si Atom.

Θ (deg) 0 5 10 15 30 45
Bi (diag.) 13.6 11.6 10.3 9.4 8.3 8.3
Bi (lat.) 13.9 11.8 10.3 9.4 8.2 8.7
Sb (diag.) 13.0 11.2 10.1 9.3 8.3 8.3
Sb (lat.) 13.6 11.6 10.3 9.4 8.2 8.6