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. 2021 Jul 29;77(Pt 8):1027–1039. doi: 10.1107/S2059798321006288

Table 1. Data-collection and refinement statistics.

Values in parentheses are for the highest resolution shell.

  Inactive (PDB entry 7lz9) Activated (PDB entry 7lza)
Data-collection statistics
 Diffraction source Beamline 17-ID-1 (AMX), NSLS-II Beamline 17-ID-1 (AMX), NSLS-II
 Wavelength (Å) 0.920089 0.920091
 Temperature (K) 100 100
 Detector EIGER 9M EIGER 9M
 Resolution range (Å) 32.75–2.30 (2.38–2.30) 28.85–2.03 (2.10–2.03)
 Space group P6522 P6522
a, b, c (Å) 74.38, 74.38, 138.23 97.37, 97.37, 118.65
 α, β, γ (°) 90.0, 90.0, 120.0 90.0, 90.0, 120.0
 Total No. of observations 27079 (24618) 94478 (8396)
 No. of unique reflections 10592 (1033) 21574 (1981)
 Average multiplicity 25.6 (23.8) 4.4 (4.2)
 Completeness (%) 99.5 (98.9) 97.5 (91.8)
 Mean I/σ(I) 10.9 (1.9) 15.3 (3.5)
 Estimated Wilson B factor (Å2) 33.8 42.4
R merge 0.246 (1.953) 0.052 (0.406)
R meas 0.251 (1.996) 0.059 (0.463)
R p.i.m. § 0.049 (0.404) 0.028 (0.145)
 CC1/2 0.998 (0.696) 0.998 (0.916)
Refinement and model statistics
 Resolution range (Å) 32.75–2.30 (2.38–2.30) 28.85–2.03 (2.10–2.03)
 No. of reflections used 10062 (1033) 21562 (1978)
 Reflections used for R free 529 (52) 1077 (98)
R work 0.202 (0.268) 0.182 (0.198)
R free 0.256 (0.339) 0.222 (0.252)
 Solvent content (%) 44 62
 No. of non-H atoms
  Protein 1594 1685
  Water 28 184
  Mg2+ 1 1
  {\rm BeF}_{3}^{-} 1
 Average B value (Å2) 43.0 41.4
 R.m.s. deviations from ideality
  Bond lengths (Å) 0.003 0.01
  Angles (°) 0.59 0.85
 Residue distribution in Ramachandran plot
  Most favored region (%) 97.6 97.2
  Allowed (%) 2.4 2.8
  Outliers (%) 0.0 0.0
 Clashscore 1.86 3.52

R merge = \textstyle \sum_{hkl}\sum_{i}|I_{i}(hkl)- \langle I(hkl)\rangle|/\textstyle \sum_{hkl}\sum_{i}I_{i}(hkl), where Ii (hkl) is the ith measurement of reflection hkl.

R meas (or redundancy-independent R merge) = \textstyle \sum_{hkl}\{N(hkl)/[N(hkl)-1]\}^{1/2}\sum_{i}|I_{i}(hkl)- \langle I(hkl)\rangle|/\textstyle \sum_{hkl}\sum_{i}I_{i}(hkl), where I i(hkl) is the ith measurement and N(hkl) is the redundancy of each unique reflection hkl (Diederichs & Karplus, 1997).

§

R p.i.m. = \textstyle \sum_{hkl}\{1/[N(hkl)-1]\}^{1/2}\sum_{i}|I_{i}(hkl)- \langle I(hkl)\rangle|/\textstyle \sum_{hkl}\sum_{i}I_{i}(hkl), where I i (hkl) is the ith measurement and N(hkl) is the redundancy of each unique reflection hkl (Weiss, 2001).

CC1/2 is the correlation coefficient between two randomly chosen half data sets (Karplus & Diederichs, 2012).