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. 1994 Sep-Oct;99(5):641–671. doi: 10.6028/jres.099.059

Fig. 9.

Fig. 9

Low accelerating voltage (1.0 kV), high resolution image using an instrument with extended field technology the sample is “grass” on a silicon wafer, (a) Lower magnification image taken at 50 000 × and (b) higher magnification image taken at 100 000 ×. (Courtesy of Hitachi Scientific Instruments.)