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. 2021 Jul 28;26(15):4574. doi: 10.3390/molecules26154574

Figure 2.

Figure 2

XRD patterns of untreated (SHI-R) and treated (SHI-W, SHI-OH, SHI-C and SHI-H) hemp shive samples. The Miller indices of the main lattice planes of the cellulose are reported in round brackets. Diffraction peaks are indicated as 101, 101¯, 021, 002, and 040 reflections.