Skip to main content
. 2021 Aug 11;12:4868. doi: 10.1038/s41467-021-25135-z

Fig. 5. Lifetime measurements.

Fig. 5

a Variation of normalized luminance vs. time and driving voltage vs. time for initial luminance of 1000 or 5000 cd m−2. b Electroluminescence spectra of the fresh and degraded device. TOF-SIMS profiles of the c fresh and d degraded OLED stack: the x-axis represents the materials depth distribution starting with the cathode interface from data point 0 and reaching to the ITO anode electrode.