Fig. 4.

200 nm tetraspeck beads imaged with HIT-SIM in two colors. (a) wide-field (above the cut) versus SIM (below the cut) with 488 nm excitation. (b) wide-field (above the cut) versus SIM (below the cut) with 561 nm excitation. (c) Wide-field and (d) SIM of the inset in (a), 488 nm excitation. (e) Wide-field and (f) SIM of the inset in (b), 561 nm excitation. (g) Lineplot of the region marked in (c), (d), (e) and (f), with wide-field in dotted lines and SIM in full lines (488 and 561 nm excitation in blue and green respectively). This dataset was obtained using the 1.75× enhancement settings.