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. 2021 May 26;15(3):433–439. doi: 10.1055/s-0041-1725576

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European Journal of Dentistry. This is an open access article published by Thieme under the terms of the Creative Commons Attribution-NonDerivative-NonCommercial-License, permitting copying and reproduction so long as the original work is given appropriate credit. Contents may not be used for commercial purposes, or adapted, remixed, transformed or built upon. (https://creativecommons.org/licenses/by-nc-nd/4.0/).

This is an open-access article distributed under the terms of the Creative Commons Attribution-NonCommercial-NoDerivatives License, which permits unrestricted reproduction and distribution, for non-commercial purposes only; and use and reproduction, but not distribution, of adapted material for non-commercial purposes only, provided the original work is properly cited.

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Fig. 1 — A representative scanning electron micrograph of the enamel surfaces treated with the different toothpastes during the pH cycling (images above) and after the erosive challenge (images below). ( A, B ) The morphological aspect of the control (untreated area) before and after the erosive challenge of the control, untreated group; ( C, D ) Morphology of the enamel surface treated with toothpaste containing NR-5 technology (Regenerate Enamel Science), before and after the erosive challenge. ( E, F ) Representative image of the morphology of the enamel surface treated with the product containing REFIX technology before and after the erosive challenge. ( G, H ) Representative micrograph of the morphology of the enamel surface treated with a product containing Novamin (Sensodyne Repair & Protect), before and after the erosive challenge. Mag, magnification. WD. Working distance. EHT: Electron high tension. HV. high vacuum. WD. Working distance. CME-UFPR. Centro de Microscopia Eletrônica da Universidade Federal do Paraná. There is no need to spell out VEGA3, TESCAN. These words are specifications of the SEM model.