Figure 10.
ToF-SIMS maps of Li plating on Cu films. CuO (65CuO–) map of SEI on Li-plated Cu for (a) d-HCl-Cu and (b) c-AcH-Cu. Maps of (c) LiF2– and (d) OH– and (e) 3D reconstruction (XZ-plane) of LiF2– and (f) OH– of eSEI0.1V on d-HCl-Cu. Images a–d are point-to-point normalized to total counts. SEI on plated lithium and exposed copper areas is labeled as Li and Cu, respectively.