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. 2021 Jul 23;11(8):1886. doi: 10.3390/nano11081886

Table 5.

XPS results for the AO-exposed and unexposed PI films.

Samples Relative Atomic Concentration (%)
Unexposed Samples AO-exposed Samples
Si2p C1s O1s N1s F1s Si2p C1s O1s N1s F1s
6FPI-0 0 75.74 12.44 2.58 6.58 0 70.81 18.03 2.62 4.54
6FPI-5 5.09 66.58 19.08 3.67 4.39 18.34 35.80 40.43 1.65 3.78
6FPI-10 6.24 67.07 16.07 2.09 8.28 20.08 31.16 44.15 1.14 3.47
6FPI-15 3.14 76.48 13.57 1.64 4.44 17.87 36.74 40.18 1.74 3.47
6FPI-20 2.96 64.63 18.08 3.52 7.56 21.25 28.07 46.51 1.06 3.10
6FPI-25 9.43 66.55 18.74 1.92 3.36 17.30 39.29 38.33 1.84 3.24