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. Author manuscript; available in PMC: 2022 Apr 1.
Published in final edited form as: Appl Radiat Isot. 2020 Dec 31;170:109572. doi: 10.1016/j.apradiso.2020.109572

Table 12.

Summary of half-lives determined in this study. For the NIST HPGe half-lives, the fits performed using Genie, 2000 were used to calculate the half-lives for each gamma-ray emission and the summation of all three. For both NPL and NIST, the reported half-life of 224Ra by HPGe was taken from the summation of the net peak areas of the three gamma-ray emissions analyzed. The uncertainty on the final NPL and NIST HPGe half-life is the combined standard uncertainty of the components in Tables 10 and 13. The “final” half-lives are given in bold.

Line/keV Fit T1/2/d uc/d
NIST - IC 3.6321 0.0028

NIST - HPGe 238 Genie (2000) 3.6327 0.0027
241 3.6317 0.0035
583 3.6307 0.0028
Σ238,241,583 3.6323 0.0027


NPL - HPGe Σ238,241 LET + HET 3.6269 0.0048
583 3.6235 0.0048
Σ238,241,583 3.6262 0.0048