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. Author manuscript; available in PMC: 2022 Jul 1.
Published in final edited form as: IEEE J Solid-State Circuits. 2021 Feb 9;56(7):2142–2157. doi: 10.1109/jssc.2021.3056040

Fig. 16.

Fig. 16.

(a) Effective gain and (b) SNR as a function of the input artifact peak-to-peak voltage, measured for single-ended, differential and common-mode artifact waveforms. The error-bars show ±1σ variation across the 8 recording channels.