TABLE I.
This work | [28] VLSI’ 17 | [39] JSSC’ 20 | [42] SSCL’ 18 | [43] JSSC’ 16 | [32] TBCAS’ 18 | [17] VLSI’ 16 | [38] VLSI’ 17 | [24] JSSC” 6 | [15] JSSC’ 18 | |
---|---|---|---|---|---|---|---|---|---|---|
Technology (nm) | 180 | 180 HV | 130 | 65 | 180 | 40/HV 180a | 180 | 65 | 180 | 130 |
Supply voltage (V) | 1, 3 | 1, 3∼12 | 0.6, 1.2, 3.3 | 1 | - | 0.6, 1.2, 1.8, ±5 | 0.8, 3.3 | 0.5, 2.5 | 1.8, 2, 3∼12 | 1.2, 3.3 |
IRNb (μVrms) | 6.2c/11d,e | 1.6 | 1.6 | 7.5c/8.2d | 3.05 | 2.2 | 5.9f | 2.78 | 2.09 | 12.0 |
Signal BW (Hz) | 200 g -9k | DC-500 | 1–500 | 10–8.3k | 1–2k | 1–250 | 17–1.65k | 1–1k | 0.59–117 | 0.5–10k |
Voltage gain (dB) | 27.6–50.0 | NA | NA | 45–65 | 40–60 | NA | 42 | NA | 50–70 | 6–69.5 |
ADC res./ENOB(b) | 10/8.6 | 15/10.2 | 12/11.3 | 10/- | 10/- | NA/12.8 | 8/- | 14/- | 10/7.8i | 10/- |
THDj | 0.9% 2mVpp,in 1kHz 50dB | 0.7% 0–1Vpp,in 60Hz | - | 0.4% 1.2mVpp,in 1kHz 65dB | - | 0.009k% 0–1Vpp,in 203Hz | - | - | 0.4i% 8.9mVpp,in 97Hz 50dB | 0.89% 20mVpp,in 10kHz 54dB |
AFE power/Ch(μW) | 2.5 | NA | NA | 1.8 | 0.24 | NA | 0.8 | 2.98i | 3.75 | 25.2 |
ADC power/Ch(μW) | 0.38 | 8.0 | 1.7 | - | 0.09 | 8.2 | - | - | - | 0.88 |
Canc. power/Ch(μW) | 1.42 | NA | NA | 0.9 | - | NA | NA | - | NA | NA |
Rec. area/Ch (mm2) | 0.66 | - | 0.023 | 0.18 | 0.17 | 0.12 | 0.04 | 0.15 | 0.56 | 0.1h |
# Rec front-ends / Stimulation cores | 8 / 2 | 64 / 4 | 32 / 32 | 64 / 2 | 8 / 4 | 32 / 8 | 16 / 1 | 1 | 16 / 16 | 1024 / 64 |
# Artifact cancelers | 8 | 0 | 0 | 8 | 8 | 4 | 0 | 1 | 0 | 0 |
Artifact cancellation method | FE filter | NA | NA | FE filter | FE filter | BE filter | NA | FE template subtraction | - | - |
# Filter taps, type and learning algorithm | 2, IIR, sign-sign LMS | NA | NA | 32, FIR, sign-sign LMS | 8, FIR, sign-sign LMS | 16, FIR, normalized LMS | NA | NA | NA | NA |
Max # uncorrelated stimulation artifacts mitigated by each canceler | 2 | NA | NA | 1 | 1 | 1 | NA | 1 | NA | NA |
Die size (mm2) | 11.76 | 11.52 | 1.0h,l | 5.14 | 1.74l | 9.88/16.43a | 1.1l | - | 25.0 | 192m |
AFE: LNA+PGA, FE: front-end, BE: back-end
NA: Not applicable
-: Not reported
Separate neural recording and stimulation chips in different technologies were fabricated.
Integrated input referred noise measured for the reported bandwidth.
Standalone AFE w/o the front-end CDAC.
w/ the front-end CDAC.
AFE (max gain setting)+ADC quantization noise.
Measured for 10Hz-10kHz.
The high-pass corner was limited because the pseudo-resistors in the amplifier had to be shorted to prevent any disruption in the biasing due to the substrate DC leakage currents.
Estimated.
AFE+ADC.
THD measured for the given single-tone input amplitude, frequency and AFE gain.
Reported HD3, the design uses a nonlinearity correction block.
Active area (excluding pads).
Includes 16k electrode sites and active pixels.