Figure 2.
Structural information for the three samples A, B and C. Cyan points: scattered intensity I exp(q), black dashed lines: form factor, red lines: I(q) fitted with Equation (8). For clarity, the curves are multiplied by a factor. On the right-hand side, single-shot speckle patterns from the three samples are reported. In order to highlight the speckles, a median filter has been applied to the images. The AGIPD is not optimized for SAXS-XPCS experiments, due to the presence of large gaps between the modules and the necessity to mask large areas of the detector. Nevertheless, it is still possible to obtain high-quality data owing to the high repetition rate of this device. The black bar in the pattern (A) indicates a distance of 0.5 nm−1 in the scattering plane.