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. 2021 Aug 13;7:61. doi: 10.1038/s41378-021-00288-5

Fig. 4. Comparison of the measured reflections (S11) of two fabricated SAW devices with the same f-IDT parameters where one has a reflector on the exterior side of the f-IDTs and the other does not.

Fig. 4

The shaded region indicates the working range of frequencies used for the particle localization experiments.