Figure 8.
XPS-peaks of porous aluminum oxide films, measured after 40 min of sputtering (ja = 200 mA·cm−2; 2.5 g·L−1 arsenazo-I): (a) C1s; (b) deconvolution of C1s-peaks; (c) Al2p; (d) O1s; (e) deconvolution of O1s-peak; (f) As3d.
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