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. 2021 Sep 6;14(17):5118. doi: 10.3390/ma14175118

Figure 9.

Figure 9

Elemental composition of porous aluminum oxide films according to XPS spectra (ac); analysis of XPS spectra anodized samples, after 40 min of sputtering: (df) relation of peak areas C1s/Al2p; (gi) atomic relation of O/Al. Galvanostatic anodizing with 15 (a,d,g), 100 (b,e,h), and 200 mA·cm−2 (c,f,i), respectively.