Sample fabrication and characterization
(A) Flow chart showing the progress of sample fabrication.
(B) SEM images showing the surface morphology of different samples.
(C) Water contact angles of samples (n = 4).
(D and E) (D) Survey XPS spectra as well as (E) atomic percentages determined on different samples.
(F–I) High-resolution C 1s spectra of (F) P, (G) P-D, (H) P-DP, and (I) P-DPI samples. ∗p < 0.05 and ∗∗∗p < 0.001 compared with the P group, whereas ###p < 0.001 compared with the P-DPI group.