Table 2.
Experimental positron lifetime component results for MAPbI3 thin film and single crystal samples.
| Sample | Source | E (keV) | τ1 (ps) | I1 (%) | τ2 (ps) | I2 (%) | τ3 (ns) | I3 (%) | κ2 (s−1) |
|---|---|---|---|---|---|---|---|---|---|
| Film | Oxford | 2 | 119(45) | 2.2(8) | 371(5) | 94(1) | 0.7(1) | 3.5(1.6) | 5.6(2.2) x 109 |
| Crystal | Dundee | 4 | 42(10) | 4.6(5) | 368(4) | 94(3) | 0.6(3) | 1.5(2.5) | 2.0(5) x 1010 |
| Film (Standard) | Liverpool | 2.5 | 109(19) | 2.7(3) | 375(1) | 97.3(2) | 2.3(4) | 0.05(1) | 6.3(1.1) x 109 |
| Film (Anneal A) | Liverpool | 2.5 | 49(27) | 2(1) | 367(1) | 98(1) | 1.4(1) | 0.29(4) | 7.5(1.2) x 109 |
| Film (Anneal B) | Liverpool | 2.5 | 110(24) | 2.3(3) | 370(1) | 97.4(3) | 1.7(1) | 0.27(3) | 1.7(9) x 1010 |
Deconvolved component lifetime values, τ, intensities, I, calculated defect position trapping rates, κ2, and the positron implantation energies, E.