Table 1.
Techniques for characterization of physical and chemical properties.
| Characterization of Chemical Properties | Characterization of Physical Properties | ||
|---|---|---|---|
| Technique | Parameter | Technique | Parameter |
| Elemental analysis | Loading/degree of derivatization |
SEM | Particle morphology and size |
| FTIR | Identification of functional groups/derivatization pattern | N2 or argon adsorption isotherms at the temperature of liquid nitrogen in conjunction with BET theory | Surface area Pore volume |
| Inductively coupled plasma-atomic emission spectrometry (ICP-AES) |
Determination of metallic impurities in silica or modified silica materials |
Low-angle powder X-ray diffraction (XRD) | Pore size |
| NMR | Structure elucidation of organic and inorganic compounds | Laser particle sizer analysers | Particle size |
| TGA | Determination of silanol groups quantity, quantification of organic groups presented and estimation of thermal stability |
Combination of XRD data and average pore diameter | Wall thickness |
| Diffuse reflectance infrared Fourier-transform spectrometry (DRIFTS) | Evaluation of silanol density and water adsorption on silica surface | TEM | Pore size |