Fig. 2. Defect activity in binary mixtures.
(A) Reconstructed images of emitters on flakes in binary solutions of water and organic solvents (here, water/acetone) at various volume fraction XH2O and with corresponding ensemble emission spectra in the insets. Defects with emission spectra λA and λB are represented in green and red, respectively. Defects with unassigned spectra are represented in white. The intensity scale for rendering defect density is the same in all conditions except for XH2O = 0.01, where the intensity scale is reduced by a factor of 10. (B) Zoom-in in the white box on the reconstructed images in (A) showing individual defect luminescence localization events irrespective of their emission spectra and rendered with fixed uncertainty of 20 nm. (C) Relative proportion of the spectral population θA = NA/(NA + NB) and θB = 1 − θA for decreasing water content. (D) Respective density ρA and ρB of active defects per frame for decreasing water content. Error bars in (C) and (D) correspond to the SD over two superresolved images reconstructed from 10,000 frames. Larger error bars at XH2O = 0.4 and 0.2 in (C) are due to the progressive increase of the number of alkylated defects over the two successive images. (E) Schematic of defect surface state in various solvent conditions.