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. Author manuscript; available in PMC: 2022 Feb 27.
Published in final edited form as: ACS Sens. 2021 Aug 18;6(8):3133–3143. doi: 10.1021/acssensors.1c01359

Figure 1.

Figure 1.

Dual in-plane nanopore device. (A) SEM image of the Si mold master. The two in-plane nanopores are 5 μm apart from each other. AFM scans of the (B) TPGDA resin stamp and (C) imprinted PMMA substrate. Tapping-mode AFM scans were acquired at 0.5 Hz scanning frequency using a high aspect ratio tip with a radius of <2 nm.