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. 2021 Sep 16;24(10):103138. doi: 10.1016/j.isci.2021.103138

Figure 6.

Figure 6

Measured computing-in-memory waveforms of skewed 3T3R SRAM cell

(A and D) Circuit diagram of 3T3R computing-in-memory SRAM cell with NAND and NOR operations, respectively.

(B and E) Waveform test of NAND and NOR computing-in-memory operation.

(C and F) The output results of NAND and NOR computing-in-memory operation at different input conditions and storage states.