Decay lifetimes (τi), pre-exponential coefficients (αi) and chi-squared (χ2) values obtained from the reconvolution analysis of emission decay curves measured for the DMTPS-Sil-dU(600)-x and DTMPS-dU(600)-x series, detected at the emission wavelength of 600 nm, upon excitation at 375 nm. The PLQY values of each sample are also reported.
Sample | τ 1 (ns) | τ 2 (ns) | τ 3 (ns) | τ 4 (ns) | α 1 | α 2 | α 3 | α 4 | χ 2 | PLQYa |
---|---|---|---|---|---|---|---|---|---|---|
dU(600) | 0.87 | — | 4.51 | 11.74 | 0.64 | — | 0.28 | 0.08 | 1.46 | 4.1% ± 0.4% |
DMTPS-Sil-dU(600)-0.014 | 0.71 | 2.04 | 4.52 | 11.38 | 0.44 | 0.28 | 0.22 | 0.05 | 1.16 | 36.7% ± 2.1% |
DMTPS-Sil-dU(600)-0.14 | 0.68 | 1.98 | 4.70 | 11.23 | 0.32 | 0.51 | 0.16 | 0.02 | 1.28 | 68.1% ± 6.9% |
DMTPS-Sil-dU(600)-1.4 | 0.40 | 2.18 | 4.79 | 11.72 | 0.28 | 0.50 | 0.22 | 0.01 | 1.21 | 76.9% ± 4.1% |
DMTPS-dU(600)-0.014 | 0.64 | 2.45 | 4.54 | 12.29 | 0.48 | 0.16 | 0.36 | 0.07 | 1.21 | 20.3% ± 4.0% |
DMTPS-dU(600)-0.14 | 0.62 | 2.28 | 5.51 | 12.52 | 0.41 | 0.21 | 0.35 | 0.03 | 1.07 | 43.1% ± 1.8% |
DMTPS-dU(600)-1.4 | 0.56 | 2.55 | 5.53 | 12.20 | 0.09 | 0.39 | 0.50 | 0.02 | 1.34 | 52.6% ± 2.2% |
Average values and errors are the mean and standard deviation of three independent measurements (λex = 370 nm for dU(600) and 410 nm for DMTPS-Sil-dU(600)-x and DMTPS-dU(600)-x).