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. 2021 Sep 16;9(39):13914–13925. doi: 10.1039/d1tc02794h

Decay lifetimes (τi), pre-exponential coefficients (αi) and chi-squared (χ2) values obtained from the reconvolution analysis of emission decay curves measured for the DMTPS-Sil-dU(600)-x and DTMPS-dU(600)-x series, detected at the emission wavelength of 600 nm, upon excitation at 375 nm. The PLQY values of each sample are also reported.

Sample τ 1 (ns) τ 2 (ns) τ 3 (ns) τ 4 (ns) α 1 α 2 α 3 α 4 χ 2 PLQYa
dU(600) 0.87 4.51 11.74 0.64 0.28 0.08 1.46 4.1% ± 0.4%
DMTPS-Sil-dU(600)-0.014 0.71 2.04 4.52 11.38 0.44 0.28 0.22 0.05 1.16 36.7% ± 2.1%
DMTPS-Sil-dU(600)-0.14 0.68 1.98 4.70 11.23 0.32 0.51 0.16 0.02 1.28 68.1% ± 6.9%
DMTPS-Sil-dU(600)-1.4 0.40 2.18 4.79 11.72 0.28 0.50 0.22 0.01 1.21 76.9% ± 4.1%
DMTPS-dU(600)-0.014 0.64 2.45 4.54 12.29 0.48 0.16 0.36 0.07 1.21 20.3% ± 4.0%
DMTPS-dU(600)-0.14 0.62 2.28 5.51 12.52 0.41 0.21 0.35 0.03 1.07 43.1% ± 1.8%
DMTPS-dU(600)-1.4 0.56 2.55 5.53 12.20 0.09 0.39 0.50 0.02 1.34 52.6% ± 2.2%
a

Average values and errors are the mean and standard deviation of three independent measurements (λex = 370 nm for dU(600) and 410 nm for DMTPS-Sil-dU(600)-x and DMTPS-dU(600)-x).