Fig. 14.

Ratio of the ${\sigma }_{\mathrm{vis}}$ evaluated from the overlap integral of the reconstructed single-bunch profiles in two (BI method) or three (luminous region evolution) spatial dimensions to that determined by the vdM method, assuming factorization, and their combination. The central values are displayed as points or with a line while the corresponding full uncertainties are shown as hatched areas. Different methods (including the combination) are color coded. Each point corresponds to one scan pair in fills 4266 (left) and 4954 (right). The statistical uncertainty is shown by the error bars