Table 4.

Summary of contributions to the relative systematic uncertainty in ${\sigma }_{\mathrm{vis}}$ (in %) at $\sqrt{s}=13\text{TeV}$ in 2015 and 2016. The systematic uncertainty is divided into groups affecting the description of the vdM profile and the bunch population product measurement (normalization), and the measurement of the rate in physics running conditions (integration). The fourth column indicates whether the sources of uncertainty are correlated between the two calibrations at $\sqrt{s}=13\text{TeV}$

Source	2015 (%)	2016 (%)	Corr
Normalization uncertainty
Bunch population
Ghost and satellite charge	0.1	0.1	Yes
Beam current normalization	0.2	0.2	Yes
Beam position monitoring
Orbit drift	0.2	0.1	No
Residual differences	0.8	0.5	Yes
Beam overlap description
Beam-beam effects	0.5	0.5	Yes
Length scale calibration	0.2	0.3	Yes
Transverse factorizability	0.5	0.5	Yes
Result consistency
Other variations in ${\sigma }_{\mathrm{vis}}$	0.6	0.3	No
Integration uncertainty
Out-of-time pileup corrections
Type 1 corrections	0.3	0.3	Yes
Type 2 corrections	0.1	0.3	Yes
Detector performance
Cross-detector stability	0.6	0.5	No
Linearity	0.5	0.3	Yes
Data acquisition
CMS deadtime	0.5	< 0.1	No
Total normalization uncertainty	1.3	1.0	–
Total integration uncertainty	1.0	0.7	–
Total uncertainty	1.6	1.2	–