Table 1. Standardized Fractional Atomic Coordinates and Isotropic Displacement Parameters for Ho₂Ni_0.769(5)Si_1.231(5) [oP32; Pnma (No. 62)]^a.

atom		atomic coordinates			occupation
Zr2Ni0.48P	Ho2Ni0.769(5)Si1.231(5)	x	z	Uiso [Å2]	Zr2Ni0.48P	Ho2Ni0.769(5)Si1.231(5)
Zr1	Ho1	0.03409(2)	0.78768(4)	0.0068(1)	1	1
Zr2	Ho2	0.14664(3)	0.09384(4)	0.0068(1)	1	1
Zr3	Ho3	0.27026(3)	0.35569(4)	0.0069(1)	1	1
Zr4	Ho4	0.39340(3)	0.03006(4)	0.0058(1)	1	1
Ni1	Ni1	0.34860(8)	0.7825(1)	0.0074(2)	0.19(6)	1
Ni2	Ni2/Si	0.4575(1)	0.4723(1)	0.0072(5)	0.76(2)	0.516(9)/0.484(9)
P1	Si1/Ni	0.0714(2)	0.3435(2)	0.0075(7)	1	0.978(9)/0.022(9)
P2	Si2	0.2148(2)	0.6561(2)	0.0072(5)	1	1

^aU_eq is defined as one-third of the trace of the orthogonalized U_ij tensor. The crystallographic data of the prototype Zr₂Ni_0.48P [oP32–y; Pnma (No. 62)] are also reported for comparison. All atoms are in the 4c Wyckoff position (x, ¹/₄, z).