Table 3. Properties of phase-detecting methods available at SAGA Light Source.

Method	Phase-detecting device	Sensitivity	Dynamic range	Scan time for CT	Spatial resolution
Grating-based X-ray interferometry	X-ray gratings	Low	Middle	2 h for mono SR	∼10 µm
				5 min for white SR
Crystal-based X-ray interferometry	Crystal X-ray interferometer	High	Narrow	∼2 h	∼30 µm
Diffraction enhanced imaging	Analyzer crystal (single crystal)	Middle	Middle	<30 min	∼10 µm
Propagation-based imaging	–	Low	Wide	1 h	∼3 µm