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. 2021 Nov 2;143(44):18626–18634. doi: 10.1021/jacs.1c08550

Figure 2.

Figure 2

SEM images showing the effect of a 5 MeV He microbeam in different operational modes on UiO-66 single crystals on Si substrates for equivalent dose per unit area: (a) using a focused stationary beam; (b) using a raster scan beam.