Table 5.

Summary of Constraints on Abundance Parameters

Quantity	Best-fit value	Posterior mean and standard deviation	Posterior 95% range
109Np (cm−2 sr−1 s−1 MeV−1)	4.512	4.544 ± 0.097	[4.369,4.715]
XHe × 10−4	9.044	8.975 ± 0.264	[8.499, 9.508]
X C	2578.407	2553.666 ± 66.318	[2442.083, 2666.097]
X N	210.667	221.389 ± 12.245	[199.314, 246.589]
X O	3372.090	3335.543 ± 82.290	[3184.869, 3492.503]
X 20Ne	304.155	306.029 ± 26.345	[259.181, 357.127]
X 22Ne	97.767	94.118 ± 22.321	[50.997, 137.982]
X Na	33.578	35.931 ± 2.812	[31.065, 41.583]
X 24Mg	583.254	548.250 ± 40.044	[472.095, 623.988]
X 25Mg	80.104	87.010 ± 28.553	[35.980, 143.917]
X 26Mg	85.998	100.340 ± 23.765	[55.965, 147.898]
X Al	79.410	78.102 ± 3.211	[72.186, 83.727]
X 28Si	643.797	629.755 ± 21.512	[589.202, 669.806]
X 29Si	44.661	47.725 ± 10.524	[27.996, 67.989]
X 30Si	32.996	38.987 ± 8.010	[23.997, 54.992]
Experimental nuisance parameters HEAO80 mod (MV)	593.085	591.606 ± 11.074	[573.154, 610.848]
ACECRIS99 mod (MV)	329.543	340.231 ± 14.137	[315.514, 371.142]
PAMELA08 mod(MV)	664.817	671.463 ± 21.223	[630.303, 708.612]
Variance rescaling parameters τ HEAO80 log τ	−0.615	−0.594 ± 0.062	[−0.721, −0.478]
ACECRIS99 log τ	−1.162	−1.269 ± 0.120	[−1.465, −1.037]
CREAM05 log τ	−1.039	−1.008 ± 0.087	[−1.184, −0.853]
PAMELA08 log τ	−1.500	−1.499 ± 0.001	[−1.499, −1.494]
TRACER06 log τ	−1.712	−1.563 ± 0.185	[−1.921, −1.228]