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. 2021 Nov 18;11:22531. doi: 10.1038/s41598-021-01282-7

Table 3.

Thickness of films, deposited on different substrates.

NPs content (%) 0 2.5 5 10 20
Thickness d (nm) of films onto silicon substrates for XRD 703 727 669 693 650
Films on silicon substrates for ellispometry 844 523 651 835 842
Films on quartz substrates for transmission 384 420 430 443 450