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. 2021 Nov 13;11(11):3052. doi: 10.3390/nano11113052

Figure 6.

Figure 6

TEM analysis for samples Cu-06, CuZ-06-03, and CuZA-06-03-1. Fast Fourier transforms (FFT) of the highlighted regions are provided, alongside selected area electron diffraction (SAED) patterns and a high-resolution TEM (HRTEM) image of a ZnO crystalline domain in sample CuZA-06-03-01.