FIB	Focused ion beam
MO	Magneto-optical
AFM	Atomic force microscopy
EDS	Energy Dispersive X-ray Spectrometry
SEM	Scanning Electron Microscope
GF	Grooved Film
PF	Plain Film
S	Plain region of Grooved Film
S′	Groove region of Grooved Film
$T_c$	Superconducting critical temperature
WL	Weak-link
$T_c^{WL}$	Weak-link critical temperature
$H_{\mathrm{rem}}$	Remnant DC magnetic field
h	Applied excitation field amplitude
T	Temperature
$\rho \left(T\right)$	Temperature-dependent resistivity
n	Power-law exponent in $\rho \left(T\right)$
$A_S$ ($A_{S^{\prime }}$)	Cross-section area of the grain (groove)
$I_S$ ($I_{S^{\prime }}$)	Length of the grain (groove)
${\rho }_0$	Residual resistivity
${\rho }_{S^{\prime }}$	Groove resistivity
${\rho }_G$	Grain resistivity
${\rho }_{epi}$	Electron-phonon-impurity resistivity contribution
${\rho }_{sd}$	$sd$ interband scattering resistivity contribution
${\rho }_{ss}$	$ss$ intraband scattering resistivity contribution
${\rho }_{10}$	Resistivity at 10 K
${\rho }_{300}$	Resistivity at 300 K
$V_{\mathrm{G}}$	Voltage measured between electrodes 2 and 3 (plain region)
$V_{\mathrm{SS}\prime \mathrm{S}}$	Voltage measured between electrodes 3 and 4 (SS′S contribution)
B	Electron-phonon-impurity coefficient
${\Theta }_D$	Debye temperature
$T_{\max }$	Upper limit of temperature to fit $\rho \left(T\right)$
${\chi }_{AC}\left(T\right)$	Temperature-dependent AC susceptibility
${\chi }^{\prime }$	Real part of ${\chi }_{AC}$
${\chi }^{″}$	Imaginary part of ${\chi }_{AC}$
f	Frequency
R	Resistance
$RRR$	Residual resistivity ratio
l	Mean free path
$\xi$	Coherence length
$\lambda$	Penetration depth
$H_{c2}$	Upper critical field