The characteristics of XRD spectra for Ni nanowires in PAAM.
Sample no | Crystal orientation (HKL) | 2 Theta, deg. | FWHM, deg. | Intensity, % | Size of coherence region (D), nm |
---|---|---|---|---|---|
1 | Ni (200) | 44.43 | 0.28 | 7.98 | 30.6 |
Ni (111) | 51.81 | 0.47 | 2.41 | 18.8 | |
Ni (220) | 76.31 | 0.35 | 100 | 29.0 | |
2 | NiO (111) | 38.33 | 0.45 | 4.84 | 22.3 |
Ni (111) | 44.51 | 0.53 | 5.47 | 16.3 | |
Ni (200) | 51.88 | 1.17 | 2.65 | 7.7 | |
Ni (220) | 76.34 | 0.36 | 100 | 28.0 | |
3 | NiO (111) | 38.50 | 0.33 | 1.04 | 30.4 |
Ni (111) | 44.63 | 0.49 | 0.81 | 17.6 | |
Ni (200) | 51.98 | 0.75 | 0.45 | 11.8 | |
Ni (220) | 76.40 | 0.34 | 100 | 24.8 | |
4 | NiO (111) | 38.47 | 0.34 | 2.78 | 29.5 |
Ni (111) | 44.58 | 0.51 | 2.47 | 16.8 | |
Ni (200) | 51.94 | 0.76 | 1.27 | 11.6 | |
Ni (220) | 76.37 | 0.36 | 100 | 27.7 |