Table 2. Lattice Parameters, the Substrate-Induced Strain εa and εc along the In-Plane and Out-of-Plane Directions, Respectively, the Peak Widths from 2θ (004) Peak and ϕ (224) Peak as well as the Thickness (d) of the GCMO Films on Different Substrates Calculated from the Room-Temperature XRD and XRR Dataa.
| substrate | a (Å) | b (Å) | c (Å) | εa (%) | εc (%) |
|---|---|---|---|---|---|
| STO | 5.41(5) | 5.46(3) | 7.52(3) | 0.2 | 0.03 |
| SLAO | 5.30(4) | 5.30(2) | 7.72(3) | –2.22 | 2.7 |
| LSAT | 5.34(1) | 5.37(5) | 7.61(4) | –1.08 | 1.2 |
| Δ2θ (deg) | Δϕ (deg) | ra (nm) | d (nm) | |
|---|---|---|---|---|
| STO | 0.68 | 2.7 | 0.69 | 56 |
| SLAO | 0.52 | 1.7 | 0.9 | 45 |
| LSAT | 0.34 | 52 |
a
The RMS roughness (ra) is calculated from the images taken by atomic force microscopy. The numbers in the brackets correspond to the standard deviations of the least significant digits of the parameter values. The peaks of GCMO on LSAT overlap with the substrate peaks and therefore the peak widths cannot be determined.