Skip to main content
. 2021 Dec 12;14(24):7648. doi: 10.3390/ma14247648

Figure 6.

Figure 6

Representative AFM topographical acquisitions of different DHT and DHT/EDC substrates in comparison with SIS patch. In the histogram, the roughness (Rq) values were reported as mean value with their standard deviations. Statistical analysis: ANOVA test (* p < 0.001).