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. 2021 Dec 10;21(24):8271. doi: 10.3390/s21248271

Table 2.

Failure rate of each elements in DRAM devices per billion hours (FIT) [27].

Failure Mode Failure Rate (FIT)
Transient Permanent
Single-bit 14.2 18.6
Single-word 1.4 0.3
Single-column 1.4 5.6
Single-row 0.2 8.2
Single-bank 0.8 10.0
Multiple-bank 0.3 1.4
Multiple-rank 0.9 2.8