Fig. 1. Topography micrographs of 3Y-TZP (left), 4Y-PSZ (center) and 5Y-PSZ (right column) ceramics under 2000× magnification in the first row, 10000× in the second row, and the fracture surfaces in the third row. It possible to observe the grain morphology and the presence of pores, mainly in 4Y- and 5Y-PSZ ceramics (yellow arrows indicate pores/surface defects). Regarding the fracture patterns, all images were observed in secondary electrons, the specimen was submitted to tensile stress at the bottom and compression stress at the top – arrows indicate the fracture origin, and H indicates hackles.